Semiconductors Front-end manufacturing process
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AnnealingClick here! -
CVD Deposition -
PhotolithographyClick here! -
EtchingClick here! -
Ion Implantation
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PVD CoatingClick here! -
CMP PolishingClick here! -
CDS liquid supply system -
Semiconductors Facilities systems
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AnnealingClick here! -
CVD DepositionClick here! -
CDS liquid supply systemClick here!
Application points of semiconductors
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AnnealingThe oxidation process generates a silicon dioxide (SiO ₂) layer by reacting silicon with oxygen (O ₂) or water vapor (H ₂ O) at high temperatures, which is used as a gate dielectric or isolation layer; The annealing process repairs lattice damage, activates doped atoms, or optimizes film properties by heating (such as rapid thermal annealing RTA).
The key equipment for oxidation annealing process is vertical furnace and rapid heat treatment equipment (RTP), each equipped with 4-6 working units (PM), each PM including 1 cooler, 1 pump, and 1 gas box. Nitrogen (N ₂), hydrogen (H ₂), or inert gas (Ar) are commonly used to control the reaction environment during the processing.
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HazardsPrecautions are required to prevent gas leaks. The raw materialgas and byproduct gas contains combustible gas in the formof hydrogen (H2) and toxic gases such as trichlorosilane (SiHCI3) and hydrogen chloride (HCI).
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Hazards
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PhotolithographyThe oxidation process generates a silicon dioxide (SiO ₂) layer by reacting silicon with oxygen (O ₂) or water vapor (H ₂ O) at high temperatures, which is used as a gate dielectric or isolation layer; The annealing process repairs lattice damage, activates doped atoms, or optimizes film properties by heating (such as rapid thermal annealing RTA).
The key equipment for oxidation annealing process is vertical furnace and rapid heat treatment equipment (RTP), each equipped with 4-6 working units (PM), each PM including 1 cooler, 1 pump, and 1 gas box. Nitrogen (N ₂), hydrogen (H ₂), or inert gas (Ar) are commonly used to control the reaction environment during the processing.
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HazardsPrecautions are required to prevent gas leaks. The raw materialgas and byproduct gas contains combustible gas in the formof hydrogen (H2) and toxic gases such as trichlorosilane (SiHCI3) and hydrogen chloride (HCI).
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Hazards
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EtchingThe oxidation process generates a silicon dioxide (SiO ₂) layer by reacting silicon with oxygen (O ₂) or water vapor (H ₂ O) at high temperatures, which is used as a gate dielectric or isolation layer; The annealing process repairs lattice damage, activates doped atoms, or optimizes film properties by heating (such as rapid thermal annealing RTA).
The key equipment for oxidation annealing process is vertical furnace and rapid heat treatment equipment (RTP), each equipped with 4-6 working units (PM), each PM including 1 cooler, 1 pump, and 1 gas box. Nitrogen (N ₂), hydrogen (H ₂), or inert gas (Ar) are commonly used to control the reaction environment during the processing.
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HazardsPrecautions are required to prevent gas leaks. The raw materialgas and byproduct gas contains combustible gas in the formof hydrogen (H2) and toxic gases such as trichlorosilane (SiHCI3) and hydrogen chloride (HCI).
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Hazards
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PVD CoatingThe oxidation process generates a silicon dioxide (SiO ₂) layer by reacting silicon with oxygen (O ₂) or water vapor (H ₂ O) at high temperatures, which is used as a gate dielectric or isolation layer; The annealing process repairs lattice damage, activates doped atoms, or optimizes film properties by heating (such as rapid thermal annealing RTA).
The key equipment for oxidation annealing process is vertical furnace and rapid heat treatment equipment (RTP), each equipped with 4-6 working units (PM), each PM including 1 cooler, 1 pump, and 1 gas box. Nitrogen (N ₂), hydrogen (H ₂), or inert gas (Ar) are commonly used to control the reaction environment during the processing.
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HazardsPrecautions are required to prevent gas leaks. The raw materialgas and byproduct gas contains combustible gas in the formof hydrogen (H2) and toxic gases such as trichlorosilane (SiHCI3) and hydrogen chloride (HCI).
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Hazards
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CMP PolishingThe oxidation process generates a silicon dioxide (SiO ₂) layer by reacting silicon with oxygen (O ₂) or water vapor (H ₂ O) at high temperatures, which is used as a gate dielectric or isolation layer; The annealing process repairs lattice damage, activates doped atoms, or optimizes film properties by heating (such as rapid thermal annealing RTA).
The key equipment for oxidation annealing process is vertical furnace and rapid heat treatment equipment (RTP), each equipped with 4-6 working units (PM), each PM including 1 cooler, 1 pump, and 1 gas box. Nitrogen (N ₂), hydrogen (H ₂), or inert gas (Ar) are commonly used to control the reaction environment during the processing.
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HazardsPrecautions are required to prevent gas leaks. The raw materialgas and byproduct gas contains combustible gas in the formof hydrogen (H2) and toxic gases such as trichlorosilane (SiHCI3) and hydrogen chloride (HCI).
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Hazards
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AnnealingThe oxidation process generates a silicon dioxide (SiO ₂) layer by reacting silicon with oxygen (O ₂) or water vapor (H ₂ O) at high temperatures, which is used as a gate dielectric or isolation layer; The annealing process repairs lattice damage, activates doped atoms, or optimizes film properties by heating (such as rapid thermal annealing RTA).
The key equipment for oxidation annealing process is vertical furnace and rapid heat treatment equipment (RTP), each equipped with 4-6 working units (PM), each PM including 1 cooler, 1 pump, and 1 gas box. Nitrogen (N ₂), hydrogen (H ₂), or inert gas (Ar) are commonly used to control the reaction environment during the processing.
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HazardsPrecautions are required to prevent gas leaks. The raw materialgas and byproduct gas contains combustible gas in the formof hydrogen (H2) and toxic gases such as trichlorosilane (SiHCI3) and hydrogen chloride (HCI).
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Hazards
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CVD DepositionThe oxidation process generates a silicon dioxide (SiO ₂) layer by reacting silicon with oxygen (O ₂) or water vapor (H ₂ O) at high temperatures, which is used as a gate dielectric or isolation layer; The annealing process repairs lattice damage, activates doped atoms, or optimizes film properties by heating (such as rapid thermal annealing RTA).
The key equipment for oxidation annealing process is vertical furnace and rapid heat treatment equipment (RTP), each equipped with 4-6 working units (PM), each PM including 1 cooler, 1 pump, and 1 gas box. Nitrogen (N ₂), hydrogen (H ₂), or inert gas (Ar) are commonly used to control the reaction environment during the processing.
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HazardsPrecautions are required to prevent gas leaks. The raw materialgas and byproduct gas contains combustible gas in the formof hydrogen (H2) and toxic gases such as trichlorosilane (SiHCI3) and hydrogen chloride (HCI).
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CDS liquid supply systemThe oxidation process generates a silicon dioxide (SiO ₂) layer by reacting silicon with oxygen (O ₂) or water vapor (H ₂ O) at high temperatures, which is used as a gate dielectric or isolation layer; The annealing process repairs lattice damage, activates doped atoms, or optimizes film properties by heating (such as rapid thermal annealing RTA).
The key equipment for oxidation annealing process is vertical furnace and rapid heat treatment equipment (RTP), each equipped with 4-6 working units (PM), each PM including 1 cooler, 1 pump, and 1 gas box. Nitrogen (N ₂), hydrogen (H ₂), or inert gas (Ar) are commonly used to control the reaction environment during the processing.
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HazardsPrecautions are required to prevent gas leaks. The raw materialgas and byproduct gas contains combustible gas in the formof hydrogen (H2) and toxic gases such as trichlorosilane (SiHCI3) and hydrogen chloride (HCI).
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